Category Archives: Press Release

AccuStrata Exhibiting at the ​21st American Conference on Crystal Growth and Epitaxy

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Rockville, MD, July, 2017: Come see us at the ​21st American Conference on Crystal Growth and Epitaxy where we will be exhibiting our latest technology in advanced monitoring systems for epitaxial growth processes. The exhibition will be held from  July 30, 2017 to August 01, 2017 at the El Dorado Hotel & Spa in Santa Fe, New Mexico, United States. AccuStrata’s President, Dr. George Atanasoff, will also be giving a lecture on state-of-the-art process monitoring systems and how they are advancing deposition process control. The lecture will be held at 8:30 AM on August 3, 2017. See http://www.crystalgrowth.org/ for more details on the show. Hope to see you there!

AccuStrata is exhibiting at CLEO in San Jose

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Rockville, MD, January, 2017: Come see us at CLEO 2017 where we will be exhibiting our latest technology in handheld, rack mounted and advanced monitoring systems. AccuStrata will be exhibiting from  May 16, 2017 to May 18, 2017 at the San Jose Convention Center in San Jose, California, United States. See http://www.cleoconference.org/home/ for more details on the show. Please visit us at Booth 2237. Hope to see you there!

AccuStrata is exhibiting at Photonics West 2017 in San Francisco

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Rockville, MD, January, 2017: Come see us at Photonics West 2017 where we will be exhibiting our latest technology in handheld, rack mounted and advanced monitoring systems. AccuStrata will be exhibiting from  January 31, 2017 to February 2, 2017 at the Moscone Center in San Francisco, California, United States. You can find us at Booth Number 1746. Please go to: http://spie.org/conferences-and-exhibitions/photonics-west

Presentation at SPIE Optics + Photonics 2016

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Rockville, MD, August, 2016: AccuStrata presented on its cutting-edge work in in situ atomic absorption spectroscopy at the 2016 SPIE Optics + Photonics Exhibition in San Diego, California in August. During the show AccuStrata gave a talk entitled Fiber-optic based in-situ atomic spectroscopy for manufacturing of x-ray optics where it introduced its new technology for deposition rate monitoring to the broader X-Ray optics community. The presentation on the work can be found in the proceedings under section 9962-14 during Session 5. The published work can also be found as doi: 10.1117/12.2240406