AccuStrata utilizes one of the best-equipped and professionally staffed microanalysis labs in the country. At our facility, we can perform thin film material and surface and failure analysis. We have access to the following equipment:

• X-ray Photoelectron Spectroscopy (XPS)
• UV/Visible/Near-IR/IR Spectroscopy
• Spectroscopic Ellipsometry (SE)
• Scanning Probe Microscopy (SPM)
• Differential Scanning Calorimetry (DSC)
• X-ray Diffraction (X-ray Crystallography)
• Transmission Electron Microscopy (TEM)
• Ultra-High Resolution Scanning Electron Microscopy (SEM)
• Mass Spectrometry
• Nuclear Magnetic Resonance
• Dielectric Analyzer (DEA)
• Gel Permeation Chromatography (GPC)
• Frequency Response Analysis (FRA)
• Dynamic Mechanical Analysis (DMA)

AccuStrata has the unique capability to measure and study optical scattering from thin film and scattering map of samples and provide comprehensive data related preparedness, cleanliness, surface roughness, thin film homogeneity, film uniformity over the entire substrate, anisotropy, porosity and contamination. In addition we have our own coating capabilities, which include:

• Dual Ion Beam Sputtering
• Plasma Assisted Electron Beam Evaporation
• Magnetron Sputtering
• Ion Etching
• Atomic Layer Deposition

Our Services

• Process Optimization
• Material Characterization
• Testing