Thin Film Solar Panels
AccuStrata’s solution for reducing the cost of thin film solar panels is focused on increasing the power solar panels generate by controlling:
- Film thickness and uniformity over the large area of the panel
- Short and long-term drifts of film thickness and uniformity
- Optical constants n&k and their variation over the panel area or homogeneity in film depth (in case of stationary deposited panels)
- Optical constants: short and long-term drift
- Film density and its uniformity and their short- and long-term drifts
- Film porosity, water content and related degradation
- Film material bandgap, uniformity, homogeneity, time drift
- Film spectral scattering coefficient and its distribution over the panel area
The control system monitors the deposited films inside the deposition chambers as films are being deposited. All thin films such as CIGS, CdTe, CdS, a-Si, micromorph-Si, TCO are monitored individually or in conjuction one with another by sharing data from the individual monitoring stages and optimizing the PV junction properties in real time.
AccuStrata’s control system operates by monitoring spectral reflectance and scattering of the films as the substrate moves through the deposition chamber. The control system takes immediate corrective actions as soon as deviations are detected by performing minor real-time re-optimization of the remaining part of the process sequence in order to compensate for the detected error and adjust the subsequent deposition processes to achieve a near “gold standard panel”.
Please play our short video demonstration.
University of Maryland Research Park
M-Square Technology Ventures Building,
5000 College Avenue, Suite#3102
College Park, MD 20740,
301.314.2116 (tel) | 240.223.5400(tel)
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